Garbelini and his team used a process known as Wireless Fuzzing to test Qualcomm's chips for flaws in its firmware. Garbelini’s team includes SUTD PhD student Zewen Shang, SUTD research group member Assistant Professor Sudipta Chattopadhyay and collaborators from the Agency for Science, Technology and Research’s (A*STAR) Institute for Infocomm Research (I2R), Dr Sumei Sun and Dr Ernest Kurniawan.
Security flaws that could have wiped out 5G connection for about 59% of the world’s mobile phones was recently discovered by Dr Matheus E. Garbelini, a PhD graduate student at the Singapore University of Technology and Design (SUTD).
The vulnerability findings – tracked as CVE-2023-33044, CVE-2023-33043 and CVE-2023-33042 – involved Qualcomm’s 5G chips used in popular phone models. As many as 714 smartphone models from 24 brands were impacted, including those from Vivo, Xiaomi, OPPO, Samsung, Honor, Motorola, realme, OnePlus, Huawei, ZTE, Asus, Sony, Meizu, Nokia, Apple and Google.
